High-reliability rad hard MOSFETs undergo extensive screening and quality conformance testing to ensure that devices perform to specification in the harshest environments. For Defense Logistics Agency ...
Toshiba Starts Shipping Test Samples of 1200V Trench-Gate SiC MOSFET that will Enhance Efficiency in Next-Generation AI Data Centers Toshiba Electronic Devices & Storage Corporation ("Toshiba") today ...
The reliability of typical SiC MOSFETs is degraded by increased On-resistance when its body diodes are bipolar energized [3] during reverse conduction operation [4]. Toshiba SiC MOSFETs alleviate this ...
Designers that rely on Single-pulse Avalanche energy, EAS, alone for an application can be in for a surprise. This article will demystify this relatively unknown parameter that sheds light on the ...
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