Electronic Design

11,000-Probe Card Tests 300-mm DRAMs In Only Six Touchdowns

Based on FormFactor's scalable MicroSpring interconnect technology, the PH150 probe card enables the testing of 300-mm DRAM wafers in just six touchdowns. The ability to test a wafer in fewer ...
Electronic Design

Analyzer Tests 300-mm Probe Card Arrays

Enhancing the capabilities of the Probilt PB6500 probe card analyzer is a 12" diameter tungsten-carbide measurement chuck with dual cameras and extended stage travel that allows probe arrays as big as ...
Semiconductor Engineering

From Reactive Replacement To Predictive Planning: Unlocking Probe Card Intelligence With Real-Time Data

Probe cards are among the most critical — and costly — assets in wafer test. Even if production line typically prepares on-demand spares, unexpected failure can cause significant downtime and ...
Digi Times

CHPT expects probe card orders to pick up in 2H24

Chunghwa Precision Test Tech (CHPT), an IC test interface solutions provider, is optimistic about demand spurred by AI servers and smartphones and projects a surge in probe card orders in the second ...
Digi Times

STAr Technologies unveils 3D/2.5D MEMS micro-cantilever WAT probe card

STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima Series probe card is ...