The wafer inspection business is heating up as chipmakers encounter new and tiny killer defects in advanced devices. Last month ASML Holding entered into an agreement to acquire Hermes Microvision ...

A new statistical method has been developed and successfully tested for calibrating magnetic-flux-leakage and ultrasonic in-line inspection tools from field verifications. In contrast to the methods ...

Several vendors are ramping up new inspection equipment based on infrared, optical, and X-ray technologies in an effort to reduce defects in current and future IC packages. While all of these ...

While non-destructive in-line monitoring at manufacturing sites is essential for safe distribution cycles of pharmaceuticals, efforts are still insufficient to develop analytical systems for detailed ...