An attention-enhanced version of the YOLOv8s computer-vision model achieved a precision of 93.2%, an F1-score of 92.7% and a ...
“Semiconductor lithography inspection requires reliable detection of small pattern defects such as bridge, burr, pinch, and contamination. In this study, we propose a two-stage vision-language ...
A new review describes how AI-based imaging and sensing technologies can detect packaging film defects that traditional meat ...
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